Benches that scale with the lot.
One daemon per station, every station on the same control plane, add a bench without re-plumbing the lab.
Industries
Semiconductors & Electronics
Characterization at production tempo
Parametric test and device characterization with SMUs, scopes, and AWGs, from first silicon on the probe station to a queryable dataset the whole team shares.
The problem
Characterization data scatters across instrument GUIs, CSVs, and engineers' laptops. By the design review, half the runs can't be found or trusted.
Full-buffer captures.
Transients, eye diagrams, and settling behavior arrive as complete waveforms, not decimated streams.
From probe to report.
Every device's I-V and timing data lands as a versioned dataset ready for analysis, dashboards, and the design review.
Instruments we speak
Source-measure unitsParametric analyzersProbe-station controllersOscilloscopesLCR metersArbitrary waveform generatorsSpectrum & network analyzersDC power supplies
Connected over SCPI/VISA, Modbus, NI-DAQmx, or HTTP. Common models ship as ready-made profiles; author your own for anything we don't.
What we automate
Parametric I-V & timing sweeps
Drive SMUs and probe stations across every die, with results queryable the moment they land.
Full-buffer waveform capture
Transients, eye diagrams, and settling behavior arrive as complete waveforms, not decimated thumbnails.
Multi-station scale-out
A daemon per bench puts every station on one control plane, add capacity without re-plumbing the lab.
How we deploy here
We map your probe stations and parametric test benches onto one control plane, so characterization runs at production tempo and every wafer's data is queryable by the whole team the moment it lands.
How we deploy